Upcoming Events

  • FIB/SEM April 23 - April 24, 2020, Johns Hopkins Applied Research Lab,Laurel, MD. USA
  • EIPBN, May 26 - 29, 2020, New Orleans, LA. USA
  • Lehigh Microscopy School, June 3-8, 2020, Lehigh University, Bethlehem, PA. USA
  • Microscopy & Microanalysis, August 2 - 6, 2020, Milwaukee, Wisconsin. USA
  • ISTFA, Nov 15 - 17 , 2020, Los Angeles, CA. USA​


  • ​*U.S. Patents 8,740,209 & 8,789,826​​ & 10,522,324

Press Releases

  • January 27, 2015: EXpressLO LLC Releases New Specimen Preparation Solution:

  • July 29, 2014: EXpressLO LLC Granted Second U.S. Patent for Innovative Specimen Preparation Methods: 



  • June 3, 2014EXpressLO LLC Granted U.S. Patent for Flexible Specimen Carrier Support Grid: 

Our History

Lucille Giannuzzi exploited "lift out" in the mid to late 1990's after a light bulb went on the first time she saw a FIB being used for TEM specimen preparation of semiconductor materials. The technique subsequently known as ex situ lift out was used for a wide range of materials. After starting her own consulting and service business in 2010, Lucille revisited the ex situ lift out technique and developed added flexibility with a patented* grid design and method named EXpressLO™. She started offering ex situ lift out solutions including EXpressLO™ in 2012.  In the summer of 2013, Lucille spun these product offerings off and started a new company as President of EXpressLO LLC. EXpressLO LLC and customers are applying manipulation methods to FIB/PFIB specimens, particles, fibers, thin films, CNTs, and diamond anvil cell work. 

"The only thing that stays the same is change."
                                             -- Melissa Etheridge

​     "solutions that make ¢ents"
Expert ex situ Lift Out and Micromanipulation Solutions​ 
fast, easy, flexible & cost effective