EXpressLO LLC
Expert ex situ Lift Out Solutions
fast, easy, flexible & cost effective

 

Upcoming Events

  • 10th Annual FIB SEM Workshop, March 2, 2017, NIST, Gaithersburg, MD. USA.
  • TMS, February 26 - March 2, 2017, San Diego, CA USA
  • EIPBN, May 30 - June 2, 2017, Orland, FL USA
  • Microscopy & Microanalysis, August 6-10, 2017, St. Louis, MO. USA


Patents

  • ​*U.S. Patents 8,740,209 & 8,789,826


Press Releases

  • January 27, 2015: EXpressLO LLC Releases New Specimen Preparation Solution:




  • July 29, 2014: EXpressLO LLC Granted Second U.S. Patent for Innovative Specimen Preparation Methods: 

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  • June 3, 2014EXpressLO LLC Granted U.S. Patent for Flexible Specimen Carrier Support Grid: 




Our History

Lucille Giannuzzi exploited "lift out" in the mid to late 1990's after a light bulb went on the first time she saw a FIB being used for TEM specimen preparation of semiconductor materials. The technique subsequently known as ex situ lift out was used for a wide range of materials. After starting her own consulting and service business in 2010, Lucille revisited the ex situ lift out technique and developed added flexibility with a patented* grid design and method named EXpressLO™. She started offering ex situ lift out solutions including EXpressLO™ in 2012.  In the summer of 2013, Lucille spun these product offerings off and started a new company as President of EXpressLO LLC. EXpressLO LLC and customers are applying manipulation methods to FIB/PFIB specimens, particles, fibers, thin films, CNTs, and diamond anvil cell work. 

"The only thing that stays the same is change."
                                             -- Melissa Etheridge