Expert ex situ Lift Out Solutions
fast, easy, flexible & cost effective


Upcoming Events

  • 9th Annual FIB SEM Workshop, February 19, 2016, Johns Hopkins APL, Laurel, MD. USA.
  • Microscopy & Microanalysis, July 24-28, 2016, Columbus, OH. USA
  • ISTFA 2016. November 6-10, 2016.  Fort Worth, TX USA.


  • ​*U.S. Patents 8,740,209 & 8,789,826

Press Releases

  • January 27, 2015: EXpressLO LLC Releases New Specimen Preparation Solution:


  • July 29, 2014: EXpressLO LLC Granted Second U.S. Patent for Innovative Specimen Preparation Methods: 



  • June 3, 2014EXpressLO LLC Granted U.S. Patent for Flexible Specimen Carrier Support Grid: 

Our History

Lucille Giannuzzi exploited "lift out" in the mid to late 1990's after a light bulb went on the first time she saw a FIB being used for TEM specimen preparation of semiconductor materials. The technique subsequently known as ex situ lift out was used for a wide range of materials. After starting her own consulting and service business in 2010, Lucille revisited the ex situ lift out technique and developed added flexibility with a patented* grid design and method named EXpressLO™. She started offering ex situ lift out solutions including EXpressLO™ in 2012.  In the summer of 2013, Lucille spun these product offerings off and started a new company as President of EXpressLO LLC.

"The only thing that stays the same is change."
                                             -- Melissa Etheridge